Search Results - "Alabedra, R"

Low-frequency FM-noise-induced lineshape: a theoretical and experimental approach by Tourrenc, J.-P., Signoret, P., Myara, M., Bellon, M., Perez, J.-P., Gosalbes, J.-M., Alabedra, R., Orsal, B.

“…Linewidth determination by self-heterodyne or self-homodyne methods may lead to mistaken interpretation, because these measurements often include significant…”
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Low-frequency noise measurements as an investigation tool of pixel flickering in cooled Hg/sub 0.7/Cd/sub 0.3/Te focal plane arrays by Perez, J.-P., Myara, M., Alabedra, R., Orsal, B., Leyris, C., Tourrenc, J.-P., Signoret, P.

“…We report on electrical noise measurements on both Hg/sub 0.7/Cd/sub 0.3/Te test patterns and hybrid 320 /spl times/ 256 focal plane array in order to explain…”
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Correlation between electrical and optical photocurrent noises in semiconductor laser diodes by Orsal, B., Signoret, P., Peransin, J.-M., Daulasim, K., Alabedra, R.

“…The low and medium frequency (1 Hz/spl les/f/spl les/10 MHz) electrical noise characteristics of 0.98, 1.3, and 1.55 micrometer semiconductor lasers have been…”
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An Hg0.3Cd0.7Te avalanche photodiode for optical-fiber transmission systems at λ = 1.3 µm by Alabedra, R., Orsal, B., Lecoy, G., Pichard, G., Meslage, J., Fragnon, P.

“…The purpose of this paper is the characterization of Hg 0.3 Cd 0.7 Te avalanche photodiodes at γ = 1.3 µm. These devices are manufactured by tile Société…”
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Impact ionization resonance and auger recombination in Hg1 - xCdxTe (0.6 ≤ x ≤ 0.7) by Lecoy, G., Orsal, B., Alabedra, R.

“…The purpose of this paper is the study of the impact ionization and the Auger recombination in Hg 1-x Cd x Te avalanche photodiodes, with 0.6 \leq x \leq 0.7 …”
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Gate current 1/f noise in GaAs MESFET's by Vandamme, L.K.J., Rigaud, D., Peransin, J.-M., Alabedra, R., Dumas, J.-M.

“…Gate current 1/f has been investigated on commercial GaAs MESFETs. It is found that devices with slight differences in drain current noise can have quite a…”
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Low-Frequency Noise Measurements as an Investigation Tool of Pixel Flickering in Cooled Hg $_0.7 hbox Cd_0.3$ Te Focal Plane Arrays by Perez, J.-P., Myara, M., Alabedra, R., Orsal, B., Leyris, C., Tourrenc, J.-P., Signoret, P.

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Low-frequency noise measurements as an investigation tool of pixel flickering in cooled Hg sub(0.7)Cd sub(0.3)Te focal plane arrays by Perez, J-P, Myara, M, Alabedra, R, Orsal, B, Leyris, C, Tourrenc, J-P, Signoret, P

“…We report on electrical noise measurements on both Hg sub(0.7)Cd sub(0.3)Te test patterns and hybrid 320 256 focal plane array in order to explain the…”
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Determination of Multiplication Factor M for Optimum Behaviour of Avalanche by Tariq Albaldawi, R. Alabedra, G. Lecoy

“…The purpose of this paper is the determination of multiplication factor M for optimum behaviour of avalanche photodetectors. We compare two types of avalanche…”
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Multiple access optical devices in organic-mineral material by Alabedra, R., Moreau, Y., Charters, R., Porque, J., Coudray, P., Kribich, K., Etienne, P.

“…The optical fiber, which offers a large bandwidth (about five TeraHertz per telecommunication window), can be fully used only if the techniques of multiple…”
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Low-frequency noise measurements as an investigation tool of pixel flickering in cooled Hg0.7Cd0.3Te focal plane arrays by PEREZ, Jean-Philippe, MYARA, Mikhael, ALABEDRA, Robert, ORSAL, Bernard, LEYRIS, Cédric, TOURRENC, Jean-Philippe, SIGNORET, Philippe

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Rapport des coefficients d'ionisation et de bruit dans les photodétecteurs à avalanche Hg0,44 Cd0,56 Te à λ=1,6 μm by ALABEDRA, R, ORSAL, B, MAATOUGUI, A. H, RANIRIHARINOSY, K. D, GORI, P, BOISROBERT, C

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Impact ionization resonance and auger recombination in Hg(1 -x)Cd(x)Te (0.6 < = x < = 0.7) by Orsal, B, Alabedra, R

“…The purpose of this paper is the study of the impact ionization and the Auger recombination in Hg(1-x)Cd(x)Te avalanche photodiodes, with0.6 leq x leq 0.7…”
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Hg/sub 0.56/ Cd/sub 0.44/ Te 1.6- to 2.5- mu m avalanche photodiode and noise study far from resonant impact ionization by Orsal, B., Alabedra, R., Maatougui, A., Flachet, J.C.

“…An investigation was made on the avalanche multiplication and impact ionization processes in p-n/sup -/-n/sup +/ junctions formed in Hg/sub 0.56/Cd/sub 0.44/Te…”
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Hg(0.56) Cd(0.44) Te 1.6-to 2.5-mu m avalanchephotodiode and noise study far from resonant impact ionization by Orsal, B, Alabedra, R, Maatougui, A, Flachet, J C

“…An investigation was made on the avalanche multiplication and impact ionization processes in p-n(-)-n( ) junctions formed in Hg(0.56)Cd(0.44)Te solid…”
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Hg sub(0.56)Cd sub(0.44)Te 1.6- to 2.5- mu m avalanche photodiode and noise study far from resonant impact ionization by Orsal, B, Alabedra, R, Maatougui, A, Flachet, J C

“…An investigation was made on the avalanche multiplication and impact ionization processes in p-n super(-)-n super(+) junctions formed in Hg sub(0.56)Cd…”
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Hg0.56Cd0.44Te 1.6- to 2.5-μm avalanche photodiode and noise study far from resonant impact ionization by ORSAL, B, ALABEDRA, R, MAATOUGUI, A, FLACHET, J. C

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Impact ionization resonance and auger recombination in Hg 1 - x Cd x Te ( 0.6 ≤ x ≤ 0.7 ) by Lecoy, G., Orsal, B., Alabedra, R.

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Impact ionization resonance and Auger recombination in Hg sub(1-x)Cd sub(x)Te (0.6 less than or equal to x less than or equal to 0.7) by Lecoy, G P, Orsal, B, Alabedra, R

“…The purpose of this paper is the study of the impact ionization and the Auger recombination in Hg sub(1-xCd)dxTe avalanche photodiodes, with 0.6 less than or…”
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Low frequency Noise Measurements as an investigation tool of pixel flickering in cooled Hg0,7Cd0,3Te focal plane arrays by Perez, J.-P., Alabédra, R., Myara, M., Signoret, P., Leyris, C., Tourrenc, J.P.

“…We report on electrical noise measurements on both Hg0.7Cd0.3Te test patterns and hybrid 320 x 256 focal plane array in order to explain the low-frequency…”
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