Search Results - "Agopian, Paula G. D."
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1
GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes
Published in IEEE electron device letters (01-09-2016)“…This letter characterizes the generation- recombination noise of Ge pFinFETs, for three different integration schemes: shallow trench isolation (STI) first…”
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Journal Article -
2
Impact of the NW-TFET Diameter on the Efficiency and the Intrinsic Voltage Gain From a Conduction Regime Perspective
Published in IEEE transactions on electron devices (01-07-2016)“…In this work, the impact of the diameter on vertical nanowire tunnel field effect transistors is analyzed focusing on the conduction mechanism and analog…”
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Journal Article -
3
Influence of 60-MeV Proton-Irradiation on Standard and Strained n- and p-Channel MuGFETs
Published in IEEE transactions on nuclear science (01-08-2012)“…In this work the proton irradiation influence on Multiple Gate MOSFETs (MuGFETs) performance is investigated. This analysis was performed through basic and…”
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Journal Article -
4
Analog Figures of Merit of Vertically Stacked Silicon Nanosheets nMOSFETs With Two Different Metal Gates for the Sub-7 nm Technology Node Operating at High Temperatures
Published in IEEE transactions on electron devices (01-07-2021)“…The analysis of vertically stacked nanosheet (NS) n-type transistors with two different metal gate-stacks (with a total thickness of 7.5 and 4.7 nm) is…”
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5
Low-Frequency Noise Analysis and Modeling in Vertical Tunnel FETs With Ge Source
Published in IEEE transactions on electron devices (01-04-2016)“…This paper presents the low-frequency noise (LFN) behavior of vertical tunnel FETs (TFETs). The experimental input characteristics with different source…”
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Journal Article -
6
Influence of multiple conduction channels on MISHEMT's intrinsic voltage gain
Published in 2022 36th Symposium on Microelectronics Technology (SBMICRO) (22-08-2022)“…The influence of multiple channels of Si 3 N 4 / AlGaN/ AlN/ GaN Metal-Insulator-Semiconductor High Electron Mobility Transistor (MISHEMT) were analyzed…”
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Conference Proceeding -
7
Influence of the Source Composition on the Analog Performance Parameters of Vertical Nanowire-TFETs
Published in IEEE transactions on electron devices (01-01-2015)“…The goal of this paper is to study the analog performance parameters of tunnel field-effect transistors (TFETs) with different source compositions and process…”
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Journal Article -
8
Low-Frequency Noise Assessment of Different Ge pFinFET STI Processes
Published in IEEE transactions on electron devices (01-10-2016)“…An experimental low-frequency noise (LFN) assessment of long channel Ge pFinFET devices fabricated in different shallow trench isolation (STI) processes is…”
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Journal Article -
9
Experimental Analysis of MISHEMT Multiple Conductions from 200K to 450K
Published in 2022 36th Symposium on Microelectronics Technology (SBMICRO) (22-08-2022)“…In this work, the multiple conductions of a GaN based Metal-Insulator-Semiconductor High Electron Mobility Transistor (MISHEMT) when operating in a temperature…”
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Conference Proceeding -
10
Influence of gate insulator and AlGaN barrier layer on MISHEMT conduction mechanisms
Published in 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) (28-08-2023)“…The drain current in the Metal-Insulator-Semiconductor High Electron Mobility Transistor (MISHEMT) is studied as a function of AlGaN barrier layer thickness,…”
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Conference Proceeding -
11
Analysis of the trade-off between voltage gain and frequency response of OTA designed using experimental data of omega-gate nanowire SOI MOSFETs
Published in 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) (28-08-2023)“…In this paper the Omega-gate nanowire (NW) transistor applied for designing Operational Transconductance Amplifier (OTA) is studied, focusing mainly on the…”
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Conference Proceeding -
12
The conduction mechanisms analysis of AlGaN/GaN MOSHEMTs with different source/drain electrode configurations
Published in 2021 35th Symposium on Microelectronics Technology and Devices (SBMicro) (23-08-2021)“…In this work, an Al 2 O 3 /AlGaN/AlN/GaN metal oxide semiconductor high electron mobility transistor (MOSHEMT) is analyzed and the investigation of its…”
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Conference Proceeding -
13
Uniaxially strained silicon influence on Two-stage Operational Transconductance Amplifiers designed with SOI FinFET's
Published in 2022 36th Symposium on Microelectronics Technology (SBMICRO) (22-08-2022)“…This paper analyzes the influence of uniaxially strained silicon on two-stage operational transconductance amplifiers (OTA) designed with SOI FinFETs. The OTA…”
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Conference Proceeding -
14
Study of the effect of multiple conductions on threshold voltage in a MIS-HEMT from 450 K down to 200 K
Published in 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) (28-08-2023)“…In this work, the effect of the multiple conductions of a GaN based Metal-Insulator-Semiconductor High Electron Mobility Transistor (MIS-HEMT) when operating…”
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Conference Proceeding -
15
Trade-off between channel length and mechanical stress in the Operational Transconductance Amplifier designed with SOI FinFET
Published in 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) (28-08-2023)“…In this paper, the trade-off between transistor channel length and the presence (or not) of the uniaxially strained SOI FinFETs for designing Operational…”
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Conference Proceeding -
16
Influence of the Quantum Effect on the GAA Nanosheet NMOS from 200°C down to -100°C
Published in 2021 35th Symposium on Microelectronics Technology and Devices (SBMicro) (23-08-2021)“…The quantum effect on the Gate-All-Around Nanosheet (GAA NS) NMOS devices are studied in this paper from 200°C down to -100°C. The experimental results for…”
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Conference Proceeding -
17
Simple Analytical Modelling of an Electronically Tunable Potentiometer and Body Factor Influence
Published in 2021 IEEE Latin America Electron Devices Conference (LAEDC) (19-04-2021)“…This paper presents a simple analytical modelling of a Electronically Tunable Potentiometer (ETP) circuit, made of a pseudo-resistor pair and a feedback…”
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Conference Proceeding -
18
Impact of Positive Charges in a Fringing Field Bio-Tunnel-FET Device with Source Underlap
Published in 2021 IEEE Latin America Electron Devices Conference (LAEDC) (19-04-2021)“…In this paper, the sensitivity of the fringing field n-type tunneling field-effect transistor biosensor (Bio-nTFET) was investigated over the influence of…”
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Conference Proceeding -
19
Al Source-Drain Schottky contact enabling N-type (Back Enhanced) BESOI MOSFET
Published in 2022 36th Symposium on Microelectronics Technology (SBMICRO) (22-08-2022)“…This work presents for the first time the experimental and simulated characteristics of a BESOI MOSFET reconfigurable transistor with non-sintered aluminum…”
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Conference Proceeding -
20
Analysis of the ZTC-Point for Vertically Stacked Nanosheet pMOS Devices
Published in 2021 IEEE Latin America Electron Devices Conference (LAEDC) (19-04-2021)“…This paper shows an experimental analysis of the zero-temperature coefficient (ZTC) bias point of vertically stacked gate-all-around nanosheet pMOS devices…”
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Conference Proceeding