Search Results - "Adolphsen, J."

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    Single event upset rates on 1 Mbit and 256 Kbit memories: CRUX experiment on APEX by Adolphsen, J., Barth, J.L., Stassinopoulos, E.G., Gruner, T., Wennersten, M., LaBel, K.A., Seidleck, C.M.

    Published in IEEE transactions on nuclear science (01-12-1995)
    “…This paper presents the results from the CRUX experiment on the Air Force APEX satellite. The experiment monitors single event upsets on screened commercial…”
    Get full text
    Journal Article
  3. 3

    SEE data from the APEX Cosmic Ray Upset experiment: predicting the performance of commercial devices in space by Adolphsen, J., Barth, J.L., Stassinopoulos, E.G., Gruner, T., Wennersten, M., LaBel, K.A., Seidleck, C.M.

    Published in IEEE transactions on nuclear science (01-06-1996)
    “…This paper presents additional results from the CRUX experiment on the US Air Force APEX satellite. The experiment monitors single event effects on 256 Kbit…”
    Get full text
    Journal Article
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    Space Shuttle Flight Test Results of the Cosmic Ray Upset Experiment by Adolphsen, John W., Yagelowich, John J., Sahu, Kusum, Kolasinski, W. A., Koga, R., Stassinopoulos, E. G., Benton, Eugene V.

    Published in IEEE transactions on nuclear science (01-12-1984)
    “…CRUX is the first engineering flight experiment designed to test for the incidence of upsets in microcircuits by energetic particles. Harris HM 6504 4K × 1…”
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    Journal Article
  6. 6

    First observation of proton induced power MOSFET burnout in space: the CRUX experiment on APE by Adolphsen, J W, Barth, J L, Gee, G B

    Published in IEEE transactions on nuclear science (01-12-1996)
    “…Ground testing has shown that power MOSFETs are susceptible to burnout when irradiated with heavy ions and protons. Satellite data from the Cosmic Ray Upset…”
    Get full text
    Journal Article
  7. 7

    Single event upset rates on 1 Mbit and 256 Kbit memories: CRU Xexperiment on APE by Adolphsen, J, Barth, J L, Stassinopoulos, E G, Gruner, T, Wennersten, M, LaBel, K A, Seidleck, C M

    Published in IEEE transactions on nuclear science (01-12-1995)
    “…This paper presents the results from the CRUX experiment on the Air Force APEX satellite. The experiment monitors single event upsets on screened commercial…”
    Get full text
    Journal Article
  8. 8

    First observation of proton induced power MOSFET burnout in space: the CRUX experiment on APEX by Adolphsen, J.W., Barth, J.L., Gee, G.B.

    Published in IEEE transactions on nuclear science (01-12-1996)
    “…Ground testing has shown that power MOSFETs are susceptible to burnout when irradiated with heavy ions and protons. Satellite data from the Cosmic Ray Upset…”
    Get full text
    Journal Article
  9. 9

    SEE data from the APEX Cosmic Ray Upset Experiment: predicting the performance of commercial devices in space by Adolphsen, J., Barth, J.L., Stassinopoulos, E.G., Gruner, T., Wennersten, M., LaBel, K.A., Seidleck, C.M.

    “…This paper presents additional results from the CRUX experiment on the US Air Force APEX satellite. The experiment monitors single event effects on 256 Kbit…”
    Get full text
    Conference Proceeding
  10. 10

    Single event effects on commercial SRAMs and power MOSFETs: final results of the CRUX flight experiment on APEX by Barth, J.L., Adolphsen, J.W., Gee, G.B.

    “…The CRUX experiment on the APEX satellite monitored single event effects on 1 Mbit and 256 Kbit SRAMs and 100 volt and 200 volt power MOSFETs. The single event…”
    Get full text
    Conference Proceeding