Search Results - "Acharyya, D."
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1
Alcohol sensing performance of ZnO hexagonal nanotubes at low temperatures: A qualitative understanding
Published in Sensors and actuators. B, Chemical (02-06-2016)“…[Display omitted] ZnO hexagonal nanotube array was synthesized on fluorine doped tin-oxide (FTO) coated glass substrate (thickness: 1.1mm, surface Resistivity:…”
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Journal Article -
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A journey towards reliability improvement of TiO2 based Resistive Random Access Memory: A review
Published in Microelectronics and reliability (01-03-2014)“…A Resistive Random Access Memory (RRAM), where the memory performance principally originated from ‘resistive’ change rather than ‘capacitive’ one (the case…”
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3
Noise Analysis-Resonant Frequency-Based Combined Approach for Concomitant Detection of Unknown Vapor Type and Concentration
Published in IEEE transactions on instrumentation and measurement (01-08-2019)“…This paper introduces a novel measurement procedure for the concomitant detection of type and concentration of unknown target species employing a combination…”
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4
Rigorous Extraction of Process Variations for 65-nm CMOS Design
Published in IEEE transactions on semiconductor manufacturing (01-02-2009)“…Statistical circuit analysis and optimization are critical for robust nanoscale CMOS design. To accurately perform such analysis, primary process variation…”
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Journal Article -
5
An efficient BTX sensor based on ZnO nanoflowers grown by CBD method
Published in Solid-state electronics (01-04-2015)“…[Display omitted] •CBD grown ZnO nanoflower based benzene toluene and xylene sensor is developed.•Structural characterizations authenticated existence of…”
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6
Design Considerations for PD/SOI SRAM: Impact of Gate Leakage and Threshold Voltage Variation
Published in IEEE transactions on semiconductor manufacturing (01-02-2008)“…We present a critical study of the impact of gate tunneling currents on the yield of 65-nm partially depleted/silicon-on-insulator (PD/SOI) SRAM designs. A new…”
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Journal Article Conference Proceeding -
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Hardware results demonstrating defect detection using power supply signal measurements
Published in 23rd IEEE VLSI Test Symposium (VTS'05) (2005)“…The power supply transient signal (I/sub DDT/) method that we propose for defect detection analyzes regional signal variations introduced by defects at a set…”
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Conference Proceeding -
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Impedance profile of a commercial power grid and test system
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)Get full text
Conference Proceeding -
9
Hierarchical MnO2 Nanoflowers Based Efficient Room Temperature Alcohol Sensor
Published in 2018 IEEE SENSORS (01-10-2018)“…In the present work, hierarchical 3-D MnO 2 nanoflowers (consisting of 2D nanosheets) were synthesized employing hydrothermal technique and subsequently…”
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10
Electrochemically grown nono-structured TiO2 based low power resistive random access memory
Published in 2013 IEEE International Conference ON Emerging Trends in Computing, Communication and Nanotechnology (ICECCN) (01-03-2013)“…Nano TiO 2 thin film was grown on high purity Ti foil by electrochemical anodization techniques using 1 (M) as H 2 SO 4 electrolyte. Film was annealed at 600 0…”
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Conference Proceeding -
11
On-chip jitter and oscilloscope circuits using an asynchronous sample clock
Published in ESSCIRC 2008 - 34th European Solid-State Circuits Conference (01-09-2008)“…We demonstrate digital circuits for measuring the jitter histograms of gigahertz clock and data signals. The circuits do not require calibration, and an…”
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Conference Proceeding -
12
A physical unclonable function defined using power distribution system equivalent resistance variations
Published in 2009 46th ACM/IEEE Design Automation Conference (26-07-2009)“…For hardware security applications, the availability of secret keys is a critical component for secure activation, IC authentication and for other important…”
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Conference Proceeding -
13
Detecting Trojans Through Leakage Current Analysis Using Multiple Supply Pad s
Published in IEEE transactions on information forensics and security (01-12-2010)“…Hardware Trojans have emerged as a new threat to the security and trust of computing systems. Hardware Trojans are deliberate and malicious modifications to…”
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14
Calibrating power supply signal measurements for process and probe card variations
Published in Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004) (2004)“…The power supply transient signal (I/sub DDT/) methods that we propose for defect detection and localization analyze regional signal variations introduced by…”
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Conference Proceeding -
15
Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method
Published in IEEE design & test of computers (01-04-2006)“…Increasing leakage current makes single-threshold IDDQ testing ineffective for differentiating defective and detect-free chips. Quiescent-signal analysis is a…”
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16
Leveraging existing power control circuits and power delivery architecture for variability measurement
Published in 2010 IEEE International Test Conference (01-11-2010)“…Embedded test structures are increasingly being used to measure and analyze performance and power variations in product chips to better understand the impact…”
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Conference Proceeding -
17
Error-tolerant bit generation techniques for use with a hardware-embedded path delay PUF
Published in 2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) (01-06-2013)“…Cryptographic and authentication applications in application-specific integrated circuits (ASICs) and FPGAs, as well as codes for the activation of on-chip…”
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Conference Proceeding -
18
Architecture and implementation of a truly parallel ATE capable of measuring pico ampere level current
Published in 2011 IEEE International Test Conference (01-09-2011)“…With advancing technology nodes, the feature sizes of transistors are scaled down aggressively and the effects of process variations on semiconductor device…”
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Conference Proceeding -
19
Rigorous extraction of process variations for 65nm CMOS design
Published in ESSDERC 2007 - 37th European Solid State Device Research Conference (01-09-2007)“…Statistical circuit analysis and optimization are critical for robust nanoscale design. To accurately perform such analysis, primary process variation sources…”
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Conference Proceeding -
20
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect
Published in 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC) (05-06-2011)“…Variations in delay caused by within-die and die-to-die process variations and SOI history effect increase timing margins and reduce performance. In order to…”
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Conference Proceeding