Search Results - "Acharyya, D."

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  1. 1

    Alcohol sensing performance of ZnO hexagonal nanotubes at low temperatures: A qualitative understanding by Acharyya, D., Bhattacharyya, P.

    Published in Sensors and actuators. B, Chemical (02-06-2016)
    “…[Display omitted] ZnO hexagonal nanotube array was synthesized on fluorine doped tin-oxide (FTO) coated glass substrate (thickness: 1.1mm, surface Resistivity:…”
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    Journal Article
  2. 2

    A journey towards reliability improvement of TiO2 based Resistive Random Access Memory: A review by Acharyya, D., Hazra, A., Bhattacharyya, P.

    Published in Microelectronics and reliability (01-03-2014)
    “…A Resistive Random Access Memory (RRAM), where the memory performance principally originated from ‘resistive’ change rather than ‘capacitive’ one (the case…”
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    Journal Article
  3. 3

    Noise Analysis-Resonant Frequency-Based Combined Approach for Concomitant Detection of Unknown Vapor Type and Concentration by Acharyya, D., Roy Chaudhuri, R., Bhattacharyya, P.

    “…This paper introduces a novel measurement procedure for the concomitant detection of type and concentration of unknown target species employing a combination…”
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    Journal Article
  4. 4

    Rigorous Extraction of Process Variations for 65-nm CMOS Design by Wei Zhao, Liu, F., Agarwal, K., Acharyya, D., Nassif, S.R., Nowka, K.J., Yu Cao

    “…Statistical circuit analysis and optimization are critical for robust nanoscale CMOS design. To accurately perform such analysis, primary process variation…”
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    Journal Article
  5. 5

    An efficient BTX sensor based on ZnO nanoflowers grown by CBD method by Acharyya, D., Bhattacharyya, P.

    Published in Solid-state electronics (01-04-2015)
    “…[Display omitted] •CBD grown ZnO nanoflower based benzene toluene and xylene sensor is developed.•Structural characterizations authenticated existence of…”
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    Journal Article
  6. 6

    Design Considerations for PD/SOI SRAM: Impact of Gate Leakage and Threshold Voltage Variation by Kanj, R., Joshi, R.V., Sivagnaname, J., Kuang, J.B., Acharyya, D., Nguyen, T.Y., Nassif, S.

    “…We present a critical study of the impact of gate tunneling currents on the yield of 65-nm partially depleted/silicon-on-insulator (PD/SOI) SRAM designs. A new…”
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    Journal Article Conference Proceeding
  7. 7

    Hardware results demonstrating defect detection using power supply signal measurements by Acharyya, D., Plusquellic, J.

    “…The power supply transient signal (I/sub DDT/) method that we propose for defect detection analyzes regional signal variations introduced by defects at a set…”
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    Conference Proceeding
  8. 8
  9. 9

    Hierarchical MnO2 Nanoflowers Based Efficient Room Temperature Alcohol Sensor by Acharyya, D., Ghosal, S., Roychaudhuri, R., Bhattacharyya, P.

    Published in 2018 IEEE SENSORS (01-10-2018)
    “…In the present work, hierarchical 3-D MnO 2 nanoflowers (consisting of 2D nanosheets) were synthesized employing hydrothermal technique and subsequently…”
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    Conference Proceeding
  10. 10

    Electrochemically grown nono-structured TiO2 based low power resistive random access memory by Hazra, A., Acharyya, D., Bhattacharyya, P.

    “…Nano TiO 2 thin film was grown on high purity Ti foil by electrochemical anodization techniques using 1 (M) as H 2 SO 4 electrolyte. Film was annealed at 600 0…”
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    Conference Proceeding
  11. 11

    On-chip jitter and oscilloscope circuits using an asynchronous sample clock by Schaub, J.D., Gebara, F.H., Nguyen, T.Y., Vo, I., Pena, J., Acharyya, D.J.

    “…We demonstrate digital circuits for measuring the jitter histograms of gigahertz clock and data signals. The circuits do not require calibration, and an…”
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    Conference Proceeding
  12. 12

    A physical unclonable function defined using power distribution system equivalent resistance variations by Helinski, Ryan, Acharyya, Dhruva, Plusquellic, Jim

    “…For hardware security applications, the availability of secret keys is a critical component for secure activation, IC authentication and for other important…”
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    Conference Proceeding
  13. 13

    Detecting Trojans Through Leakage Current Analysis Using Multiple Supply Pad s by Aarestad, J, Acharyya, D, Rad, R, Plusquellic, J

    “…Hardware Trojans have emerged as a new threat to the security and trust of computing systems. Hardware Trojans are deliberate and malicious modifications to…”
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    Journal Article
  14. 14

    Calibrating power supply signal measurements for process and probe card variations by Acharyya, D., Plusquellic, J.

    “…The power supply transient signal (I/sub DDT/) methods that we propose for defect detection and localization analyze regional signal variations introduced by…”
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    Conference Proceeding
  15. 15

    Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method by Plusquellic, J., Acharyya, D., Singh, A., Tehranipoor, M., Patel, C.

    Published in IEEE design & test of computers (01-04-2006)
    “…Increasing leakage current makes single-threshold IDDQ testing ineffective for differentiating defective and detect-free chips. Quiescent-signal analysis is a…”
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    Journal Article
  16. 16

    Leveraging existing power control circuits and power delivery architecture for variability measurement by Acharyya, D, Agarwal, K, Plusquellic, J

    Published in 2010 IEEE International Test Conference (01-11-2010)
    “…Embedded test structures are increasingly being used to measure and analyze performance and power variations in product chips to better understand the impact…”
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    Conference Proceeding
  17. 17

    Error-tolerant bit generation techniques for use with a hardware-embedded path delay PUF by Aarestad, J., Plusquellic, J., Acharyya, D.

    “…Cryptographic and authentication applications in application-specific integrated circuits (ASICs) and FPGAs, as well as codes for the activation of on-chip…”
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    Conference Proceeding
  18. 18

    Architecture and implementation of a truly parallel ATE capable of measuring pico ampere level current by Acharyya, D., Miyao, K., Ting, D., Lam, D., Smith, R., Fitzpatrick, P., Buras, B., Williamson, J.

    Published in 2011 IEEE International Test Conference (01-09-2011)
    “…With advancing technology nodes, the feature sizes of transistors are scaled down aggressively and the effects of process variations on semiconductor device…”
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    Conference Proceeding
  19. 19

    Rigorous extraction of process variations for 65nm CMOS design by Wei Zhao, Yu Cao, Liu, F., Agarwal, K., Acharyya, D., Nassif, S., Nowka, K.

    “…Statistical circuit analysis and optimization are critical for robust nanoscale design. To accurately perform such analysis, primary process variation sources…”
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    Conference Proceeding
  20. 20

    Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect by Aarestad, Jim, Lamech, Charles, Plusquellic, Jim, Acharyya, Dhruva, Agarwal, Kanak

    “…Variations in delay caused by within-die and die-to-die process variations and SOI history effect increase timing margins and reduce performance. In order to…”
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    Conference Proceeding