Search Results - "Abraham, Mathew C."
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1
RC Performance Evaluation of Interconnect Architecture Options Beyond the 10-nm Logic Node
Published in IEEE transactions on electron devices (01-06-2014)“…This paper summarizes the findings of an RC performance modeling approach for evaluating various material and architecture options by which interconnect wires…”
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2
Fermi-level unpinning and low resistivity in contacts to n-type Ge with a thin ZnO interfacial layer
Published in Applied physics letters (29-10-2012)“…We report low resistance Ohmic contacts on n-Ge using a thin ZnO interfacial layer (IL) capped with Ti. A 350°C post metallization anneal is used to create…”
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3
Epitaxially Defined FinFET: Variability Resistant and High-Performance Technology
Published in IEEE transactions on electron devices (01-08-2014)“…FinFET technology is prone to suffer from line edge roughness (LER)-based V T variation with scaling. It also lacks a simple implementation of multiple V T…”
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4
Drug and dental impression materials
Published in Journal of pharmacy & bioallied science (01-08-2012)“…Guidelines to prevent cross contamination with infectious agents have been instituted for dental clinical and laboratory procedures. However, compliance by…”
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Journal Article -
5
Semiconductor Logic Technology Innovation to Achieve Sub-10 nm Manufacturing
Published in IEEE journal of the Electron Devices Society (01-03-2013)“…Moore's Law represents the cumulative effort by many participants to advance the productivity of electronic systems over the last 40+ years, resulting in…”
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6
Performance Evaluation of a Dual-Flow Recharge Filter for Improving Groundwater Quality
Published in Water environment research (01-07-2014)“…A dual-flow multimedia stormwater filter integrated with a groundwater recharge system was developed and tested for hydraulic efficiency and pollutant removal…”
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7
Is strain engineering scalable in FinFET era?: Teaching the old dog some new tricks
Published in 2012 International Electron Devices Meeting (01-12-2012)“…S/D epitaxy remains an effective source of strain engineering for both aggressively and conservatively scaled FinFETs. Not merging the S/D epitaxy between…”
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Conference Proceeding -
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Scarred patterns in surface waves
Published in Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics (01-02-2001)“…Surface wave patterns are investigated experimentally in a system geometry that has become a paradigm of quantum chaos: the stadium billiard. Linear waves in…”
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Scarred Patterns in Surface Waves
Published 24-02-2000“…Phys. Rev. E 63, 026208 (2001) Surface wave patterns are investigated experimentally in a system geometry that has become a paradigm of quantum chaos: the…”
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Journal Article