Search Results - "Aboyan, A. O."

Investigation of distorted subsurface layers of thick perfect crystals by Aboyan, A. O., Drmeyan, H. R.

“…The effect of crystal surface defects on the intensity of X‐ray scattering has been investigated. It was found that in the presence of distorted subsurface…”
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Structural distortions of semiconducting silicon crystals caused by constant electric field by Aboyan, A. O., Aghbalyan, S. G.

“…Structural distortions in nonpolar, particularly, in semiconducting silicon crystals, caused by constant electric field have been disclosed by means of X‐ray…”
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Features of X-ray diffraction in thick perfect crystals with deformed subsurface layers by Aboyan, A. O.

“…Diffraction of X-rays in thick perfect crystals with deformed subsurface layers has been investigated. It is shown that in deformed layers kinematic scattering…”
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X-ray interferometry study of deformation fields in silicon crystals, induced by a constant magnetic field by Drmeyan, G. R., Aboyan, A. O., Movcicyan, A. A.

“…The results of investigations of deformation fields in the dual-use unit of a silicon triple-crystal X-ray interferometer under constant magnetic field by…”
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Abstracts by Aboyan, A. O., iramdzhyan, F. O., Bezirganyan, P. A., Kolesov, S. N., Kil'deev, I. A., Kolesov, I. S., Balaban, N. B., Maslennikov, V. N., Gershanov, V. Yu, Kireev, E. I., Lozovskii, V. N., Shcherinskii, V. L., Savel'ev, G. G., Eroshkin, V. I., Mal'chenko, S. N., Klykov, I. I., Popova, T. N.

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