Search Results - "Abashin, S.L."

A method to study uniformity of electrophysical properties of high-resistance CdZnTe crystals by Komar, V.K., Chugai, O.N., Abashin, S.L., Nalivaiko, D.P., Puzikov, V.M., Sulima, S.V.

“…Uniformity of properties of a semiconductor material is one of the important conditions to achieve high spectrometric performance of ionizing radiation…”
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Optical properties and mechanisms of current flow in [Cu.sub.2]ZnSn[S.sub.4] films prepared by spray pyrolysis by Orletskii, I.G, Maryanchuk, P.D, Solovan, M.N, Brus, V.V, Maistruk, E.V, Kozyarskii, D.P, Abashin, S.L

“…Thin films [Cu.sub.2]ZnSn[S.sub.4] (up to 0.9 µm thick) with p-type conductivity and band gap [E.sub.g] = 1.54 eV have been prepared by the spray pyrolysis of…”
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Optical constants and polarimetric properties of ТіО2–MnO2 thin films by Brus, V.V., Pidkamin, L.J., Abashin, S.L., Kovalyuk, Z.D., Maryanchuk, P.D., Chugai, O.M.

“…► Optical constants of the TiO2–MnO2 thin films were determined using the envelope method. ► The polarimetric properties of the TiO2–MnO2 thin films were…”
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Silicon nanowire array architecture for heterojunction electronics by Solovan, M. M., Brus, V. V., Mostovyi, A. I., Maryanchuk, P. D., Orletskyi, I. G., Kovaliuk, T. T., Abashin, S. L.

“…Photosensitive nanostructured heterojunctions n -TiN/ p -Si were fabricated by means of titanium nitride thin films deposition ( n -type conductivity) by the…”
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Investigation of localized states in cadmium zinc telluride crystals by scanning photodielectric spectroscopy by Komar, V.K., Nalivaiko, D.P., Migal, V.P., Chugai, O.N., Puzikov, V.M., Grebenyuk, N.N., Abashin, S.L.

“…We discuss a method of scanning photodielectric spectroscopy of crystals which is based on the measurements of small increments of the real /spl Delta//spl…”
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A method to study uniformity of electric properties of high-resistance CdZnTe crystals by Komar, V.K., Chugai, O.N., Abashin, S.L., Nalivaiko, D.P., Puzikov, V.M., Sulima, S.V.

“…The paper discusses about the electric properties of high-resistance CdZnTe crystals. The suggested method detects large-scale irregularities of various…”
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