Search Results - "A. N. Pyatlitski"

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  1. 1

    Frustrated Total Internal Reflection Spectra of Diazoquinone–Novolac Photoresist Films by Brinkevich, S. D., Brinkevich, D. I., Prosolovich, V. S., Lastovskii, S. B., Pyatlitski, A. N.

    Published in Journal of applied spectroscopy (2021)
    “…Radiation-induced effects in thin films of diazoquinone–novolac photoresists on silicon irradiated with high-energy electrons (~5 MeV) were investigated by…”
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    Journal Article
  2. 2

    Attenuated Total Reflection Spectra of Nitrided SiO2/Si Structures by Odzhaev, V. B., Pyatlitski, A. N., Prosolovich, V. S., Kovalchuk, N. S., Soloviev, Ya. A., Zhygulin, D. V., Shestovsky, D. V., Yankovski, Yu. N., Brinkevich, D. I.

    Published in Journal of applied spectroscopy (01-09-2022)
    “…The behavior of nitrogen in silicon dioxide films on single-crystal silicon substrates was studied by attenuated total reflection (ATR) and time-of-flight…”
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  3. 3

    Mechanism of the Adhesive Interaction of Diazoquinone-Novolac Photoresist Films with Monocrystalline Silicon by Brinkevich, S. D., Grinyuk, E. V., Brinkevich, D. I., Sverdlov, R. L., Prosolovich, V. S., Pyatlitski, A. N.

    Published in Journal of applied spectroscopy (01-09-2020)
    “…Fourier-transform infra-red spectroscopy with frustrated total internal reflection was used to study radiation-induced processes upon the implantation of boron…”
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  4. 4

    FEMTOSECOND LASER SCRIBING OF SAPPHIRE AT WAVELENGTH 1040 AND 520 NM by B. A. Shulenkova, E. V. Lutsenko, A. V. Danilchik, Ja. A. Solovjov, A. N. Pyatlitski, M. V. Kirasirava

    “…Sapphire cutting is one of the largest markets in laser materials processing. Since sapphire is one of the hardest transparent materials its mechanical and…”
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  5. 5

    CONDENSER STRUCTURES BASED ON BARIUM TITANATE FILMS FORMED BY SOL-GEL METHOD by P. A. Kholov, N. V. Gaponenko, K. V. Shaidakova, V. I. Krymski, V. A. Filipenya, T. V. Petlitskaya, V. V. Kolos, A N. Pyatlitski

    “…The objective of the work is investigation the dielectric permittivity and dielectric loss tangent of BaTiO3 films in a capacitor structure formed by sol – gel…”
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  6. 6

    AMMONIA MOLECULAR BEAM EPITAXY OF AlGaN HETEROSTRUCTURES ON SAPPHIRE SUBSTRATES by M. V. Rzheutski, Ja. A. Solovjov, A. G. Vainilovich, I. Ya. Svitsiankou, A. N. Pyatlitski, D. V. Zhyhulin, E. V. Lutsenko

    “…In order to develop a technology for the growth of Al(Ga)N-based heterostructures, the effect of different molecular beam epitaxy growth conditions on the…”
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  7. 7

    Reflectometry technique for studying metal nanolayers on a substrate by Khomchenko, A. V., Primak, I. U., Sotsky, A. B., Korneeva, I. A., Krekatsen, N. A., Pyatlitski, A. N.

    “…A new noncontact technique is proposed for determining the parameters of nanosized metal coatings (absorption coefficients, refractive indices, and…”
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  8. 8

    QUALITY ANALYSIS OF THE GATE DIELECTRIC OF THE MOS-STRUCTURES BY CAPACITY-VOLTAGE CHARACTERISTICS by V. B. Odzhaev, A. N. Pyatlitski, V. S. Prosolovich, V. A. Filipenya, S. V. Shvedau, V. V. Chernyi, V. Yu. Yavid, Yu. N. Yankouski

    Published in Pribory i metody izmererij (01-08-2015)
    “…There were investigated the capacity-voltage characteristics of the MOS transistors, fabricated by the similar process charts, with the identical applied…”
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  9. 9

    DIELECTRICAL CHARACTERISTICS OF CAPACITOR STRUCTURES ON THE BASIS OF SOL-GEL DERIVED STRONTIUM TITANATE FILMS by A. H. Sohrabi, N. V. Gaponenko, M. V. Rudenko, S. M. Zavadski, D. A. Golosov, A. F. Guk, V. V. Kolos, A. N. Pyatlitski, A. S. Turtsevich

    “…The thin film capacitors were formed on silicon. The capacitor is based on the strontium titanate multi-layer which was fabricated using the sol-gel method…”
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  10. 10
  11. 11

    Low-resistance and high-resistance states in strontium titanate films formed by the sol–gel method by Sohrabi Anaraki, H., Gaponenko, N. V., Litvinov, V. G., Ermachikhin, A. V., Kolos, V. V., Pyatlitski, A. N., Ivanov, V. A.

    Published in Physics of the solid state (01-10-2015)
    “…A change in the resistance of strontium titanate structures formed by the sol–gel method has been demonstrated. The transition of a strontium titanate film…”
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