Search Results - "A. I. Svistun"

Universal Digital Probe Electrometer for Testing Semiconductor Wafers by A. L. Zharin, U. A. Mikitsevich, A. I. Svistun, K. U. Pantsialeyeu

“…Non-contact electrical methods are widely used for research and control of semiconductor wafers. The methods are usually based on surface potential measurement…”
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Intelligent Sensor for Measurement Systems with Sinusoidal Excitation Response by U. A. Mikitsevich, A. I. Svistun, A. V. Samarina, K. U. Pantsialeyeu, A. L. Zharin

“…Measuring devices and systems containing sensors that require sinusoidal excitation are widely used in information and measurement technology both in…”
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Charge-Sensitive Technique for Deformation Processes’ Study by K. U. Pantsialeyeu, U. A. Mikitsevich, A. I. Svistun, R. I. Vorobey, O. K. Gusev, A. L. Zharin

“…Surface charge can be used as an information parameter about the change in the state of the material under the action of mechanical stresses. The aim of the…”
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Surface Electric Potential Measurement with a Static Probe by R. I. Vorobey, O. K. Gusev, A. I. Zharin, V. A. Mikitsevich, K. U. Pantsialeyeu, A. V. Samarina, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky

“…Surface electric potential measurements are widely used in non-destructive inspection and testing of precision surfaces, for example, in the production of…”
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Series of Photovoltaic Converters Based on Semiconductors with Intrinsic Photoconductivity by R. I. Vorobey, O. K. Gusev, A. L. Zharin, K. U. Pantsialeyeu, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, L. I. Shadurskaya

“…One of the ways to solve multiple problems of optical diagnostics is to use photovoltaic converters based on semiconductors with intrinsic photoconductivity…”
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CHARACTERIZATION OF THE ELECTROPHYSICAL PROPERTIES OF SILICON-SILICON DIOXIDE INTERFACE USING PROBE ELECTROMETRY METHODS by V. А. Pilipenko, V. A. Saladukha, V. A. Filipenya, R. I. Vorobey, O. K. Gusev, A. L. Zharin, K. V. Pantsialeyeu, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky

“…Introduction of submicron design standards into microelectronic industry and a decrease of the gate dielectric thickness raise the importance of the analysis…”
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Measuring transducers for optical diagnostic system with multifunctional unitary photovoltaic converters by R. I. Vorobei, O. K. Gusev, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, L. I. Shadurskaya

“…Modern measuring transducers for optical diagnostic system should perform automatic parameter estimation of optical signal and automatic switching between…”
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DIGITAL CONTACT POTENTIAL DIFFERENCE PROBE by K. U. Pantsialeyeu, A. I. Svistun, A. K. Tyavlovsky, A. L. Zharin

“…Nowadays the technique of analog contact potential difference probes well developed. Due to the influence of various parasitic factors, analog probes has…”
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Designing and controlling the metrological parameters of photoelectric transducers based on semiconductors with multiply-charged dopants by Gusev, O. K., Svistun, A. I., Shadurskaya, L. I., Yarzhembitskaya, N. V.

“…The initial data for designing the metrological parameters of photoelectric semiconductor transducers (PST) based on semiconductors with deep multiply-charged…”
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METHODS FOR WORK FUNCTION MEASUREMENTS FOR THE TEST OF A SURFACE IN A DURING FRICTION by K. V. Panteleyev, A. I. Svistun, A. L. Zharin

“…The paper describes the electronic work function measurements by the contact potential difference technique, and experimental demonstration of the possibility…”
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METHODS FOR LOCAL CHANGES IN THE PLASTIC DEFORMATION DIAGNOSTICS ON THE WORK FUNCTION by K. V. Panteleyev, A. I. Svistun, A. L. Zharin

“…The paper describes the electronic work function measurements by the contact potential difference technique, and experimental demonstration of the possibility…”
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THE IDENTIFICATION ALGORITHM OF METROLOGICAL CHARACTERISTICS OF WIDE-RANGE PHOTOVOLTAIC SEMICONDUCTOR CONVERTERS WITH MULTIPLY IMPURITIES by O. K. Gusev, A. I. Svistun, L. I. Shadurskaya, N. V. Yarjembitskaya

“…Metrological features of photovoltaic semiconductor converters (PSC) based on semiconductors with the multiple-charge impurities are investigated in a wide…”
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THE MULTIFUNCTION MEASURING CONVERTER FOR MONITORING OF LIQUID TECHNOLOGICAL MEDIA by R. I. Vorobey, O. K. Gusev, A. L. Zharin, Yu. G. Kuzminsky, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, S. V. Shilko

“…The multifunctional sensor of solution type and concentration in a technological pipeline is developed on a basis of the methodology of measurements of…”
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KELVIN PROBE’S STRAY CAPACITANCE AND NOISE SIMULATION by S. Danyluk, A. V. Dubanevich, O. K. Gusev, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, R. I. Vorobey, A. L. Zharin

“…Stray capacitance effects and their influence on Kelvin probe’s performance are studied using mathematical and computer simulation. Presence of metal surface,…”
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Mathematical Modelling of Coordinate Paraphase Photodetector Characteristics by V. B. Yarzhembitsky, A. I. Svistun, N. V. Yarzhembitskaya

“…The paper proposes a mathematical modelling of two-barrier structure photoresponse. The analysis of spectral and coordinate characteristics of paraphase…”
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Operational Potentialities and Basic Structures of Photoelectric Zero-Detectors by V. B. Yarzhembitski, L. I. Shadurskaya, A. I. Svistun

“…The main types of basic structures of photoelectric zero-detectors which we have named, as paraphase photodetectors are considered in the paper. The paper…”
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