Search Results - "30th European Solid-State Device Research Conference"

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  1. 1
    Heading for decananometer CMOS - Is navigation among icebergs still a viable strategy?

    Heading for decananometer CMOS - Is navigation among icebergs still a viable strategy? by Skotnicki, T.

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  2. 2
    Measurements and 3D Simulations of Full-Chip Potential Distribution at Parasitic Substrate Current Injection

    Measurements and 3D Simulations of Full-Chip Potential Distribution at Parasitic Substrate Current Injection by Schenkel, M., Pfaffli, P., Mettler, S., Reiner, W., Aemmer, W.D.

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  3. 3
    Shallow and Deep Trench Isolation for use in RF-Bipolar IC:s

    Shallow and Deep Trench Isolation for use in RF-Bipolar IC:s by Forsberg, M., Bormander, C., Johansson, T., Ko, T., Liu, W., Vellaikal, M., Cheshire, A.

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  4. 4
    Device simulation of all-polymer thin-film transistors

    Device simulation of all-polymer thin-film transistors by Detcheverry, C., Matters, M.

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  5. 5
    Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors

    Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors by Palestri, P., Selmi, L., Sangiorgi, E., Pavesi, M., Widdershoven, F.

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  6. 6
    Capacitance Modelling of LDMOS Transistors

    Capacitance Modelling of LDMOS Transistors by Griffith, E.C., Kelly, S.C., Power, J.A., Bain, D., Whiston, S., Elbert, P., O'Neill, M.

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  7. 7
    Dependence of Channel Width and Length on MOSFET Matching for 0.18 um CMOS Technology

    Dependence of Channel Width and Length on MOSFET Matching for 0.18 um CMOS Technology by Difrenza, R., Llinares, P., Ghibaudo, G., Robillart, E., Granger, E.

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  8. 8
    Narrow Device Issues in Deep-Submicron Technologies-the Influence of Stress, TED and Segregation on Device Performance

    Narrow Device Issues in Deep-Submicron Technologies-the Influence of Stress, TED and Segregation on Device Performance by Nouri, F., Scott, G., Rubin, M., Manley, M., Stolk, P.

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  9. 9
    The Orientation Dependence of the Piezojunction Effect in Bipolar Transistors

    The Orientation Dependence of the Piezojunction Effect in Bipolar Transistors by Creemer, J.F., French, P.J.

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  10. 10
    Integrated Photodiodes for DVD and CD-ROM Applications

    Integrated Photodiodes for DVD and CD-ROM Applications by Kieschnick, K., Zimmermann, H., Seegebrecht, P., Pless, H.

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  11. 11
    RF Distortion Characterisation of Sub-Micron CMOS

    RF Distortion Characterisation of Sub-Micron CMOS by Tiemeijer, L.F., van Langevelde, R., Gaillard, O., Havens, R.J., Baltus, P.G.M., Woerlee, P.H., Klaassen, D.B.M.

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  12. 12
    Contribution of interface traps to valence band electron tunneling in PMOS devices

    Contribution of interface traps to valence band electron tunneling in PMOS devices by Pompl, T., Kerber, M., Wurzer, H., Eisele, I.

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  13. 13
    Investigation of Dynamic Memory Effects in Si-dot Devices

    Investigation of Dynamic Memory Effects in Si-dot Devices by De Salvo, B., Fernandes, A., Ghibaudo, G., Guillaumot, B., Baron, T., Reimbold, G.

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  14. 14
    A CPU Efficient Electron Mobility Model for MOSFET Simulation with Quantum Corrected Charge Densities

    A CPU Efficient Electron Mobility Model for MOSFET Simulation with Quantum Corrected Charge Densities by Neinhus, B., Nguyen, C.D., Jungemann, C., Meinerzhagen, B.

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  15. 15
    IC-Compatible Two-level Bulk Micromachining for RF Silicon Technology

    IC-Compatible Two-level Bulk Micromachining for RF Silicon Technology by Pham, N.P., Sarro, P.M., Ng, K.T., Burghartz, J.N.

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  16. 16
    200GHz SiGe Hetero Bipolar Transistor Design

    200GHz SiGe Hetero Bipolar Transistor Design by Eberhardt, J., Kasper, E.

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  17. 17
    Investigation of 3D Phenomena in the Triggering of gg-nMOS Electrostatic Discharge Protection Devices

    Investigation of 3D Phenomena in the Triggering of gg-nMOS Electrostatic Discharge Protection Devices by Litzenberger, M., Furbock, C., Pogany, D., Gornik, E., Esmark, K., Gossner, H.

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  18. 18
    The Proliferation of Silicon Germanium

    The Proliferation of Silicon Germanium by Schuppen, A., Tortschanoff, M., Berntgen, J., Maier, P., Zerrweck, D., von der Ropp, H., Tolonics, J., Burger, K.

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  19. 19
    Observation of a New Hole Gate Current Component in p(+)-poly Gate p-channel MOSFET's

    Observation of a New Hole Gate Current Component in p(+)-poly Gate p-channel MOSFET's by Driussi, F., Esseni, D., Selmi, L., Piazza, F.

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  20. 20
    Controlling the TCR of thin film resistors

    Controlling the TCR of thin film resistors by Steinmann, P., Jacobsen, S.M., Higgins, R.

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