Search Results - "2022 99th ARFTG Microwave Measurement Conference (ARFTG)"

Surmounting W-band Scalar Load-Pull Limitations Using the ASM-HEMT Model for Millimeter-Wave GaN HEMT Technology Large-Signal Assessment by Miller, Nicholas C., Elliott, Michael, Gilbert, Ryan, Arkun, Erdem, Denninghoff, Daniel J.

“…This paper presents for the first time an accurate ASM-HEMT model for millimeter-wave GaN HEMT technology validated with W-band scalar load-pull and power…”
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VNA-Based Testbed for Accurate Linearizability Testing of Power Amplifiers Under Modulated Signals by Messaoudi, Nizar, Ayed, Ahmed Ben, Teyssier, Jean-Pierre, Boumaiza, Slim

“…This paper presents a vector network analyzer(VNA) based testbed for accurate power amplifier (PA) linearizability testing under wideband modulated signals…”
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Effective AM/AM and AM/PM curves derived from EVM simulations or measurements on constellations by Sombrin, Jacques B.

“…Non-linear amplifiers distort signal constellations through their amplitude (AM/AM) and phase (AM/PM) curves versus input amplitude. This causes an increase in…”
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Wideband Vector Corrected Measurements on a Modified Vector Network Analyzer (VNA) System by Schulze, Christoph, Heinrich, Wolfgang, Dunsmore, Joel, Bengtsson, Olof

“…Vector corrected wideband measurements on a modified vector network analyzer system are presented using wideband modulated signals as stimulus. The modified…”
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Local-Oscillator Third-Harmonic Injection for Improved Broadband Mixer Linearity by Babenko, Akim A., Martens, Jon

“…We have studied dependencies of the mixer linearity upon injecting a third local oscillator (LO) harmonic of various magnitudes and phases relative to the LO…”
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Impact of Broadband Modulation in Active Load-Pull On-Wafer Measurements of GaN HEMTs by Angelotti, Alberto Maria, Gibiino, Gian Piero, Nielsen, Troels S., Santarelli, Alberto, Verspecht, Jan

“…This work deals with the impact of broadband modulated excitations on the load-pull characterization of gallium nitride (GaN) on-wafer high-electron-mobility…”
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The w-Plane as a Graphical Representation of Sampler Configuration in a Sampled-Network Reflectometer by Donahue, Devon T., Barton, Taylor W.

“…This paper presents a study of sampler configuration within a sampled-network reflectometer, an extension of the sampled-line. The sampled-network impedance…”
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A Single-Element CMOS-LRRM VNA Electronic Calibration Technique by Chien, Jun-Chau, Niknejad, Ali M.

“…This paper presents a single-element CMOS-based electronic calibration (E-Cal) technique for millimeter-wave VNA measurements. The structure employs a CMOS…”
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Parasitic Coupling Effects in Coplanar Short Measurements by Phung, Gia Ngoc, Arz, Uwe

“…On-wafer measurements are indispensable for the characterization of electronic devices at millimeter-wave and terahertz frequencies. Recent investigations have…”
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On coupling-related distortion behavior in mm-wave phased arrays by Martens, J.

“…Nonlinear coupling and element pulling can be contributors to distortion behavior in mm-wave phased arrays, particularly as sensitive power stages get closer…”
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Demonstration of non-invasive probing of CMOS devices with aluminum pads at frequencies up to 500 GHz by Sakamaki, R., Kishikawa, R., Tojima, Y., Kon, S., Somada, I., Matsui, S., Taoka, G., Yoshida, T., Amakawa, S., Fujishima, M.

“…This paper demonstrates non-invasive probing measurement of transmission lines on CMOS chips from 100 MHz to 500 GHz. The surface of aluminum pads are covered…”
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Single-Sweep vs. Banded Characterizations of a D-band Ultra-Low-Loss SiC Substrate-Integrated Waveguide by Li, Lei, Reyes, Steve, Asadi, Mohammad Javad, Jena, Debdeep, Xing, Huili Grace, Fay, Patrick, Hwang, James C. M.

“…A D-band (110-170GHz)SiC substrate-integrated waveguide (SIW) is characterized on-wafer by two different vector network analyzers (VNAs): a 220-GHz…”
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Determination of the Coplanar Waveguide Propagation Constant via Non-contact, On-wafer Measurements in WR1.5 Band by Wallis, T. Mitch, Little, Charles A. E., Chamberlin, Richard A., Burton, George L., Orloff, Nathan D., Long, Christian J., Sertel, Kubilay

“…We investigate on-wafer measurements made by use of a non-contact probe station in the WR1.5 band (500 GHz to 750 GHz) in order to demonstrate the potential…”
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Wideband mm-Wave Integrated Passive Tuners for Accurate Characterization of (Bi)CMOS Technologies by Margalef-Rovira, M., Maye, C., Alaji, I., Lepilliet, S., Gloria, D., Ducournau, G., Gaquiere, C.

“…This paper presents an innovative impedance tuner architecture aiming at on-wafer characterization. The proposed impedance tuner is composed of an integrated…”
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D-band Free Space Dielectric Characterization of a Low-Cost Ultradense Microdiamond Composite for Heat Spreading by Chang, Shu-Ming, Swank, Chelsea, Kummel, Andrew, Bakir, Muhannad S., Rodwell, Mark, Buckwalter, James F.

“…Low-cost dielectric materials are needed above 100 GHz with low permittivity and loss tangent as well as significant thermal conductivity (\sim 100W/m\cdot K)…”
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Traceable mm Wave Modulated-Signal Measurements for OTA Test by Kast, Joshua M., Manurkar, Paritosh, Remley, Kate A., Horansky, Rob, Williams, Dylan F.

“…We present a single-instrument solation to traceable mmWave wide-band modulated-signal measurement in OTA test environments. The approach can be used to…”
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Extending the Open-Short de-embedding frequency via metal-l on-wafer calibration approaches by Esposito, C., De Martino, C., Lehmann, S., Zhao, Z., Mothes, S., Kretzschmar, C., Schroter, M., Spirito, M.

“…In this contribution, We analyze the bandwidth versus accuracy trade-offs of conventional two-step de-embedding approaches, often employed to extract the…”
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