Search Results - "2007 44th ACM/IEEE Design Automation Conference"
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The impact of NBTI on the performance of combinational and sequential circuits
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 44th annual conference on Design automation : San Diego, California; 04-08 June 2007 (04-06-2007)“…Negative-bias-temperature-instability (NBTI) has become the primary limiting factor of circuit lifetime. In this work, we develop a general framework for…”
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Formal Techniques for SystemC Verification; Position Paper
Published in 2007 44th ACM/IEEE Design Automation Conference (01-06-2007)“…SystemC has emerged lately as a de facto, open, industry standard modeling language, enabling a wide range of modeling levels, from RTL to system level. Its…”
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Scalability of 3D-Integrated Arithmetic Units in High-Performance Microprocessors
Published in 2007 44th ACM/IEEE Design Automation Conference (01-06-2007)“…Three-dimensional integration provides a simultaneous improvement in wire-related delay and power consumption of microprocessor circuits. Prior work has looked…”
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Design-Silicon Timing Correlation A Data Mining Perspective
Published in 2007 44th ACM/IEEE Design Automation Conference (01-06-2007)“…In the post-silicon stage, timing information can be extracted from two sources: (1) on-chip monitors and (2) delay testing. In the past, delay test data has…”
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Optimization of Area in Digital FIR Filters using Gate-Level Metrics
Published in 2007 44th ACM/IEEE Design Automation Conference (01-06-2007)“…In the paper, we propose a new metric for the minimization of area in the generic problem of multiple constant multiplications, and demonstrate its…”
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Thousand Core ChipsA Technology Perspective
Published in 2007 44th ACM/IEEE Design Automation Conference (01-06-2007)“…This paper presents the many-core architecture, with hundreds to thousands of small cores, to deliver unprecedented compute performance in an affordable power…”
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Selective Band width and Resource Management in Scheduling for Dynamically Reconfigurable Architectures
Published in 2007 44th ACM/IEEE Design Automation Conference (01-06-2007)“…Partial dynamic reconfiguration (often referred to as partial RTR) enables true on-demand computing. A dynamically invoked application is assigned resources…”
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A. Richard Newton, 1951 - 2007
Published in 2007 44th ACM/IEEE Design Automation Conference (01-06-2007)“…Summary form only given, as follows. Richard was also a strong supporter of the Design Automation Conference (DAC); he was the Chair of the conference in 1991,…”
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FlexWAFE - A High-end Real-Time Stream Processing Library for FPGAs
Published in 2007 44th ACM/IEEE Design Automation Conference (01-06-2007)“…Digital film processing is characterized by a resolution of at least 2 K (2048times1536 pixels per frame at 30 bit/pixel and 24 pictures/s, data rate of 2.2…”
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Functional Verification of SiCortex Multiprocessor System-on-a-Chip
Published in 2007 44th ACM/IEEE Design Automation Conference (01-06-2007)“…This paper discusses functional verification of the SiCortex multiprocessor compute node. It is shown that the implementation of reusable verification…”
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IP Exchange: I'll Show You Mine if You Show Me Yours
Published in 2007 44th ACM/IEEE Design Automation Conference (01-06-2007)“…Between concept and production, there are many points where hardware and software developers need to exchange requirements and intellectual property. What data…”
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12
Fast, non-Monte-Carlo estimation of transient performance variation due to device mismatch
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 44th annual conference on Design automation : San Diego, California; 04-08 June 2007 (04-06-2007)“…This paper describes a noise-based method of estimating the effects of device random mismatch on circuit's transient response, such as delay and frequency. The…”
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13
Marie R. Pistilli Women in EDA Achievement Award
Published in 2007 44th ACM/IEEE Design Automation Conference (01-06-2007)Get full text
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14
Parameterized macromodeling for analog system-level design exploration
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 44th annual conference on Design automation : San Diego, California; 04-08 June 2007 (04-06-2007)“…In this paper we propose a novel parameterized macromodeling technique for analog circuits. Unlike traditional macromodels that are only extracted for a small…”
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15
Early Power-Aware Design & Validation: Myth or Reality?
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 44th annual conference on Design automation : San Diego, California (01-06-2007)“…Design for low power is crucial for developing and optimizing complex SoCs. Typically, power issues are tackled at the gate-level and backend stages,…”
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16
Modeling and analysis of non-rectangular gate for post-lithography circuit simulation
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 44th annual conference on Design automation : San Diego, California; 04-08 June 2007 (04-06-2007)“…In the nano regime it has become increasingly important to consider the impact of non-rectangular gate (NRG) shape caused due to sub-wavelength lithography…”
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17
CAD-based security, cryptography, and digital rights management
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 44th annual conference on Design automation : San Diego, California; 04-08 June 2007 (04-06-2007)“…Manufacturing variability is inherent to many silicon and nano-scale technologies and can be manifested in many different ways and modalities (e.g. power and…”
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18
Non-linear statistical static timing analysis for non-Gaussian variation sources
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 44th annual conference on Design automation : San Diego, California; 04-08 June 2007 (04-06-2007)“…Existing statistical static timing analysis (SSTA) techniques suffer from limited modeling capability by using a linear delay model with Gaussian distribution,…”
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Synthesizing SVA local variables for formal verification
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 44th annual conference on Design automation : San Diego, California; 04-08 June 2007 (04-06-2007)“…This paper describes techniques for efficiently handling a subset of System Verilog Assertion(SVA) safety properties with local variables in formal…”
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20
Modeling and estimation of full-chip leakage current considering within-die correlation
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 44th annual conference on Design automation : San Diego, California; 04-08 June 2007 (04-06-2007)“…We present an efficient technique for finding the mean and variance of the full-chip leakage of a candidate design, while considering logic-structures and both…”
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