Search Results - "1992 IEEE International SOI Conference"

1
Hydrogen Induced Positive Charging of Buried SiO/sub 2 by Stesmans, A., Vanheusden, K.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
2
Determination of Excess Carrier Lifetimes in Silicon-On-Insulator Wafers by a Contactless Optical Technique by Yang, P.C., Sheng S. Li

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
3
Analysis of Snapback in Soi nMosfets and its Use for an Soi Esd Protection Circuit by Verhaege, K., Groeseneken, G., Colinge, J.P., Maes, H.E.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
4
Dependence of Fully Depleted Soimosfet Breakdown Voltage on Film Thickness and Channel Length by Kistler, N., Ver Ploeg, E., Woo, J., Plummer, J.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
5
Detection of 0.3/spl mu/m Particles on Fully Processed Simox Wafers by Genis, A., Krull, W., Lalezari, R., Turner, J.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
6
Temperature Sensitivity of Devices and Circuits Fabricated in Fully Depleted Accumulation Mode Cmos/sol by Brady, F.T., Haddad, N.F., Wang, L.K., Miller, J.A., Seliskar, J.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
7
Strain Compensated Epitaxial Etchstop For Besoi by Maszara, W.P.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
8
Ultrathin Soi Formation by Carbon Implantation and Layer Transferring by Tong, O.-Y., You, H.-M., Cha, G., Gosele, U.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
9
Recombination of Oxidation-Induced Silicon Interstitials at Si/siO/sub 2/ Interfaces in Soi Structures by Boussey-Said, J., Guillemot, N., Stoemenos, J.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
10
Plasma thinned SOI bonded wafers by Mumola, P.B., Gardopee, G.J., Clapis, P.J., Zarowin, C.B., Bollinger, L.D., Ledger, A.M.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
11
Effect of Temperature-Dependent Bipolar Gain Distribution on Seu Vulnerability of Soi Cmos Srams by Alles, M.L., Massengill, L.W., Kerns, S.E.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
12
Comparison of Soi Versus Bulk Silicon Substrate Crosstalk Properties for Mixed-Mode IC's by Rahim, M., Bor-Yuan Hwang, Foerstner, J.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
13
Design Techniques for High-Speed Low-Power and High-Temperature Digital Cmos Circuits on Soi by Flandre, D., Jacquemin, C., Colinge, J.-P.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
14
A Linear Sweep Technique for Determining Generation Lifetimes in Soi Mosfets by Venkatesan, S., Pierret, R.F., Neudeck, G.W.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
15
Comparison of the Sensitivity to Heavy Ions of Sram in Different Simox Technologies by Ferlet-Cavrois, V., Musseau, O., Leray, J.L., Coic, Y.M., Lecarval, G., Guichard, E.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
16
Electrical and Thermal Feedback Effects on the Small-Signal Drain Characteristics of Partially-Depleted Soi Mosfets by Redman-White, W., Uren, M.J., Bunyan, R.J.T., Howes, R., Lee, M., Alderman, J.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
17
Performance Limitations of Deep-Submicron Fully Depleted Soi Mosfet's by Fossum, J.G., Krishnan, S., Yeh, P.-C.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
18
Performances of Fully-Depleted Soi Analog Operational Amplifiers by Gentinne, B., Colinge, J.P., Jespers, P.G.A.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
19
High Temperature Characteristics of Gaa/soi Transistors and Circuits by Francis, P., Terao, A., Flandre, D.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:
20
Effect of Total Dose Radiation on Device Self Latch-Up by Brady, F.T., Haddad, N.F., Wang, L.K.

Published in 1992 IEEE International SOI Conference (1992)

Get full text

Conference Proceeding
QR Code
Save to List

Saved in:

Search Results - "1992 IEEE International SOI Conference"

Hydrogen Induced Positive Charging of Buried SiO/sub 2 by Stesmans, A., Vanheusden, K.

Determination of Excess Carrier Lifetimes in Silicon-On-Insulator Wafers by a Contactless Optical Technique by Yang, P.C., Sheng S. Li

Analysis of Snapback in Soi nMosfets and its Use for an Soi Esd Protection Circuit by Verhaege, K., Groeseneken, G., Colinge, J.P., Maes, H.E.

Dependence of Fully Depleted Soimosfet Breakdown Voltage on Film Thickness and Channel Length by Kistler, N., Ver Ploeg, E., Woo, J., Plummer, J.

Detection of 0.3/spl mu/m Particles on Fully Processed Simox Wafers by Genis, A., Krull, W., Lalezari, R., Turner, J.

Temperature Sensitivity of Devices and Circuits Fabricated in Fully Depleted Accumulation Mode Cmos/sol by Brady, F.T., Haddad, N.F., Wang, L.K., Miller, J.A., Seliskar, J.

Strain Compensated Epitaxial Etchstop For Besoi by Maszara, W.P.

Ultrathin Soi Formation by Carbon Implantation and Layer Transferring by Tong, O.-Y., You, H.-M., Cha, G., Gosele, U.

Recombination of Oxidation-Induced Silicon Interstitials at Si/siO/sub 2/ Interfaces in Soi Structures by Boussey-Said, J., Guillemot, N., Stoemenos, J.

Plasma thinned SOI bonded wafers by Mumola, P.B., Gardopee, G.J., Clapis, P.J., Zarowin, C.B., Bollinger, L.D., Ledger, A.M.

Effect of Temperature-Dependent Bipolar Gain Distribution on Seu Vulnerability of Soi Cmos Srams by Alles, M.L., Massengill, L.W., Kerns, S.E.

Comparison of Soi Versus Bulk Silicon Substrate Crosstalk Properties for Mixed-Mode IC's by Rahim, M., Bor-Yuan Hwang, Foerstner, J.

Design Techniques for High-Speed Low-Power and High-Temperature Digital Cmos Circuits on Soi by Flandre, D., Jacquemin, C., Colinge, J.-P.

A Linear Sweep Technique for Determining Generation Lifetimes in Soi Mosfets by Venkatesan, S., Pierret, R.F., Neudeck, G.W.

Comparison of the Sensitivity to Heavy Ions of Sram in Different Simox Technologies by Ferlet-Cavrois, V., Musseau, O., Leray, J.L., Coic, Y.M., Lecarval, G., Guichard, E.

Electrical and Thermal Feedback Effects on the Small-Signal Drain Characteristics of Partially-Depleted Soi Mosfets by Redman-White, W., Uren, M.J., Bunyan, R.J.T., Howes, R., Lee, M., Alderman, J.

Performance Limitations of Deep-Submicron Fully Depleted Soi Mosfet's by Fossum, J.G., Krishnan, S., Yeh, P.-C.

Performances of Fully-Depleted Soi Analog Operational Amplifiers by Gentinne, B., Colinge, J.P., Jespers, P.G.A.

High Temperature Characteristics of Gaa/soi Transistors and Circuits by Francis, P., Terao, A., Flandre, D.

Effect of Total Dose Radiation on Device Self Latch-Up by Brady, F.T., Haddad, N.F., Wang, L.K.

Search Tools:

Refine Results

Format

Subject Area

Topic

Language

Year of Publication