基于IEC 61850第二版非侵入式自动测试系统的研制
为了解决智能变电站二次回路测试效率低和安全性不足的问题,引入了"非侵入式"的概念。基于IEC 61850第二版标准和自动测试技术,研制了非侵入式自动测试系统。首先分析了二次回路测试原理及目的,其次阐述了"非侵入式"系统的关键技术点。最后结合现场实际运行,提出引入了"非侵入式"概念后的安全实施方案和测试流程。通过"非侵入式"自动测试系统对智能变电站二次回路进行测试,实现了工程现场不改变站内装置配置和物理链路,即完成二次回路的测试工作,显著提高了工程测试工作的效率及智能变电站运行的安全性。...
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Published in: | 电力系统保护与控制 Vol. 45; no. 14; pp. 143 - 147 |
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Main Author: | |
Format: | Journal Article |
Language: | Chinese |
Published: |
2017
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Subjects: | |
Online Access: | Get full text |
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Summary: | 为了解决智能变电站二次回路测试效率低和安全性不足的问题,引入了"非侵入式"的概念。基于IEC 61850第二版标准和自动测试技术,研制了非侵入式自动测试系统。首先分析了二次回路测试原理及目的,其次阐述了"非侵入式"系统的关键技术点。最后结合现场实际运行,提出引入了"非侵入式"概念后的安全实施方案和测试流程。通过"非侵入式"自动测试系统对智能变电站二次回路进行测试,实现了工程现场不改变站内装置配置和物理链路,即完成二次回路的测试工作,显著提高了工程测试工作的效率及智能变电站运行的安全性。 |
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Bibliography: | smart substation; non-intrusive testing; IEC 61850; automatic test; secondary circuit 41-1401/TM ZHOU Cheng1,2, WU Hai 1,2, HU Guo1,2, HE Zhaohui1,2, LI Jia1,2, ZHENG Jie1,2 (1. NARI Group Corporation (State Grid Electric Power Research Institute), Nanjing 211106, China; 2. NARI Technology Co., Ltd., Nanjing 211106, China) In order to solve the problems of low testing efficiency and safety of the two circuits of the intelligent substation, "non-intrusive" concept test is introduced. Based on IEC 61850 second edition standard and automatic test technology, non-invasive automatic test system is developed. Firstly, this paper analyzes the secondary circuit testing principle and objective, then describes the key technology of "non-intrusive" system. Finally, combined with the actual operation, it proposes the introduction of a "non-intrusive" concept of security scheme and testing process. Through non-intrusive type automatic test system of intelligent substation secondary circuit testing, the realization of the pro |
ISSN: | 1674-3415 |