Search Results - "Šustek, Štěpán"

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  1. 1
    Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films

    Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films by Ohlídal, Ivan, Vohánka, Jiří, Buršíková, Vilma, Šulc, Václav, Šustek, Štěpán, Ohlídal, Miloslav

    Published in Optics express (23-11-2020)
    “…The method of variable angle spectroscopic ellipsometry usable for the complete optical characterization of inhomogeneous thin films exhibiting complicated…”
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  2. 2
    Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry

    Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry by Vohánka, Jiří, Šustek, Štěpán, Buršíková, Vilma, Šklíbová, Veronika, Šulc, Václav, Homola, Vojtěch, Franta, Daniel, Čermák, Martin, Ohlídal, Miloslav, Ohlídal, Ivan

    Published in Applied surface science (30-12-2020)
    “…[Display omitted] •Thickness non-uniform films are studied by variable-angle spectroscopic ellipsometry.•The shapes of non-uniformity are modeled using a…”
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