Search Results - "Ŝaroun, J."

Neutronographic Residual Stress Analysis for Materials With Depth Gradients of the Strain Free Lattice Parameter d0 for the Example of a Case-Hardened Steel 20MnCr5 by Pulvermacher, S., Šaroun, J., Cabeza, S., Pirling, T., Kornmeier, J. Rebelo, Epp, J., Hofmann, M., Gibmeier, J.

“…In the present work, ring-shaped samples made from steel 20MnCr5 were low-pressure carburized (LPC) and subsequently hardened by gas quenching (case-hardened)…”
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Residual stress instrument with double-crystal monochromator at research reactor IR-8 by Em, V.T., Karpov, I.D., Somenkov, V.A., Glazkov, V.P., Balagurov, A.M., Sumin, V.V., Mikula, P., Ŝaroun, J.

“…Residual stress instrument STRESS at 8 MW research reactor IR-8 at National Research Center “Kurchatov Institute” is described. Using double-crystal…”
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High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part I by Mikula, P., Šaroun, J., Stammers, J., Em, V.

“…Three-axis setup using a bent perfect crystal monochromator and analyzer was tested in the diffraction study of α-Fe(211) polycrystalline pins with diameters…”
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High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part II by Mikula, P., Šaroun, J., Stammers, J., Em, V.

“…As a continuation of our recent studies of α-Fe(211) samples at a scattering angle of 2θ S = 88° (Part I), a three-axis setup using bent perfect crystal…”
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Beam modulation: A novel ToF-technique for high resolution diffraction at the Beamline for European Materials Engineering Research (BEER) by Rouijaa, M., Kampmann, R., Šaroun, J., Fenske, J., Beran, P., Müller, M., Lukáš, P., Schreyer, A.

“…The Beamline for European Materials Engineering Research (BEER) is under construction at the European Spallation Source (ESS) in Lund, Sweden. A basic…”
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Effects of finish turning on an austenitic weld investigated using diffraction methods by Kornmeier, J. Rebelo, Hofmann, M., Gan, W. M., Robin, V., Valiorgue, F., Pascal, H., Gibmeier, J., Saroun, J.

“…Arc welding generally introduces undesired local residual stress states on engineering components hindering high-quality performance in service. Common…”
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A double-crystal monochromator for neutron stress diffractometry by Em, V. T., Balagurov, A. M., Glazkov, V. P., Karpov, I. D., Mikula, P., Miron, N. F., Somenkov, V. A., Sumin, V. V., Šaroun, J., Shushunov, M. N.

“…The problem of developing a dedicated neutron diffractometer for placement on a horizontal reactor channel to measure internal stresses in bulk materials and…”
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Neutron Diffraction Studies of a Fully Asymmetric Diffraction Geometry of a Bent Perfect Crystal with the Output Beam Compression by Mikula, P., Vrána, M., Šaroun, J., Em, V., Čapek, J.

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Non-destructive Neutron Surface Residual Stress Analysis by Rebelo Kornmeier, J., Hofmann, M., Gan, W. M., Gibmeier, J., Saroun, J.

“…Diffraction is a powerful tool for investigation of residual as well as applied stresses in engineering materials and components. Both X-ray and neutron…”
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Evaluation of double-crystal SANS data influenced by multiple scattering by SAROUN, J

“…Evaluation of small‐angle neutron scattering (SANS) data is often complicated by multiple scattering effects if large particles of relatively high volume…”
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Observation of multiple Bragg reflections of neutrons in bent perfect crystals by Mikula, P., Vrána, M., Šaroun, J., Seong, B.S., Em, V., Moon, M.K.

“…Multiple reflection effects resulting in Umweganregung or Aufhellung have been studied in elastically bent perfect silicon single-crystals which are often used…”
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Small angle neutron scattering on an absolute intensity scale and the internal surface of diatom frustules from three species of differing morphologies by Garvey, C. J., Strobl, M., Percot, A., Šaroun, J., Haug, J., Vyverman, W., Chepurnov, V. A., Ferris, J. M.

“…The internal nanostructure of the diatoms Cyclotella meneghiniana , Seminavis robusta and Achnanthes subsessilis was investigated using small angle neutron…”
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ThALES-Three Axis Low Energy Spectroscopy for highly correlated electron systems by Boehm, M., Steffens, P., Kulda, J., Klicpera, M., Roux, S., Courtois, P., Svoboda, P., Saroun, J., Sechovsky, V.

“…Neutron News ThALES-Three Axis Low Energy Spectroscopy for highly correlated electron systems…”
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The FlatCone multianalyzer setup for ILL's three-axis spectrometers by Kempa, M., Janousova, B., Saroun, J., Flores, P., Boehm, M., Demmel, F., Kulda, J.

“…Traditionally, the neutron three-axis spectrometers with their single analyzer/detector channel are associated with experiments aiming at detailed studies of…”
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Tailored instrumentation for long-pulse neutron spallation sources by Schober, H., Farhi, E., Mezei, F., Allenspach, P., Andersen, K., Bentley, P.M., Christiansen, P., Cubitt, B., Heenan, R.K., Kulda, J., Langan, P., Lefmann, K., Lieutenant, K., Monkenbusch, M., Willendrup, P., Šaroun, J., Tindemans, P., Zsigmond, G.

“…Long-pulse spallation sources will offer a very high time-integrated neutron flux similar to that of the best steady-state sources. Using Monte Carlo…”
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RESTRAX — a program for TAS resolution calculation and scan profile simulation by Šaroun, J., Kulda, J.

“…The RESTRAX combines the user interface of the RESCAL program, based on the commonly used formalism of Cooper and Nathans, with the more recent TRAX code,…”
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General formula for determination of cross-section from measured SANS intensities by Strunz, P., Šaroun, J., Keiderling, U., Wiedenmann, A., Przenioslo, R.

“…A detailed derivation of the formula connecting measured SANS intensity with the smeared cross‐section (raw‐data treatment) is presented. The derivation is…”
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Optimization of a focusing monochromator for neutron strain-scanning diffractometer by ?aroun, J., Pirling, T., Rogge, R.B.

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Direct comparison of SANS data with SEM image analysis by Ryukhtin, V., ?aroun, J.

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Double-Bent-Crystal Small-Angle Neutron Scattering Setting and its Applications by Strunz, P., Saroun, J., Mikula, P., Lukás, P., Eichhorn, F.

“…Theoretical relations for optimum adjustments of two arrangements of a double‐bent‐crystal (DBC) small‐angle neutron scattering (SANS) diffractometer are…”
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