Search Results - "Śniechowski, M"

Structural properties of emeraldine base and the role of water contents: X-ray diffraction and computer modelling study by Łużny, W, Śniechowski, M, Laska, J

“…The series of the polyaniline samples in the emeraldine base form was synthesised in various conditions and then it has been subjected to the experimental…”
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Multireflection grazing incidence diffraction used for stress measurements in surface layers by Marciszko, M., Baczmański, A., Wróbel, M., Seiler, W., Braham, C., Donges, J., Śniechowski, M., Wierzbanowski, K.

“…The geometry based on the multireflection grazing incidence X-ray diffraction can be applied to measure residual stresses. Using this method, it is possible to…”
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Effect of structural anisotropy on electrical and magnetic properties of polyaniline conducting films by Fedorko, P., Faure-Vincent, J., Fier, I., Walmsley, L., Sniechowski, M., Jacquot, J.F., Pron, A., Travers, J.P., Djurado, D.

“…► We measured high structural anisotropy of conducting films of PANI. ► The anisotropy concerns in-plane and out-of-plane molecular arrangements. ► We measured…”
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Direct analysis of lamellar structure in polyaniline protonated with plasticizing dopants by Sniechowski, M., Djurado, D., Dufour, B., Rannou, P., Pron, A., Luzny, W.

“…Structural disorder in polyaniline (PANI) protonated with plasticizing dopants, namely diesters of 4-sulfophthalic acid containing linear alkyl or alkoxy…”
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Force field based molecular dynamics simulations in highly conducting compounds of poly(aniline). A comparison with quasi-elastic neutron scattering measurements by Sniechowski, M., Djurado, D., Bée, M., Gonzalez, M.A., Johnson, M.R., Rannou, P., Dufour, B., Luzny, W.

“…Dynamics of counter-ions in poly(aniline) doped with di-(2-butoxyethoxyethyl)ester of 4-sulfophthalic acid have been simulated using force field based…”
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